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Measuring current drift over time with 4200-SCS

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allse87
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Measuring current drift over time with 4200-SCS

Post by allse87 » December 27th, 2016, 10:08 pm

Hello,
I would like to perform a transistor Ids drift test over time. The test should apply a constant Vds and Vgs and sample Ids every 1s, to obtain an Ids vs time curve over 3-5days. How could I implement this test using KITE? Or other method that does not involve using Labview with another Laptop.
Thank you.

Andrea C
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Re: Measuring current drift over time with 4200-SCS

Post by Andrea C » December 29th, 2016, 6:43 am

If you try to use the ITM of KITE with Sampling Mode based test, the highest number of samples supported by the ITM will be 4096.

To accomplish this from the KITE environment, you would need to use the KULT tool and write a custom library/module and then execute it from a UTM in KITE.
The main reason for this is because the total number of data points (every 1 second for multiple days) will exceed that number of rows that the KITE data sheet environment can support. Your UTM code could push the full data set to an ASCII data file for offline analysis and perhaps post a smaller subset of the data to the KITE sheet.

allse87
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Joined: February 10th, 2016, 10:54 pm
Country: Netherlands

Re: Measuring current drift over time with 4200-SCS

Post by allse87 » January 4th, 2017, 9:59 pm

Andrea C wrote:If you try to use the ITM of KITE with Sampling Mode based test, the highest number of samples supported by the ITM will be 4096.

To accomplish this from the KITE environment, you would need to use the KULT tool and write a custom library/module and then execute it from a UTM in KITE.
The main reason for this is because the total number of data points (every 1 second for multiple days) will exceed that number of rows that the KITE data sheet environment can support. Your UTM code could push the full data set to an ASCII data file for offline analysis and perhaps post a smaller subset of the data to the KITE sheet.
Thank you for the suggestion, unfortunately I have no experience using KULT, are there any examples I could use?

Kenneth P
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Re: Measuring current drift over time with 4200-SCS

Post by Kenneth P » January 9th, 2017, 10:59 am

Without a custom library, the next possible solution would be to create a series of ITM to operate in a sequence where each ITM is performing a sample at 1 second intervals. Interval timing may vary if you use auto-ranging for both sourcing and measuring operations. Any other automatic functions may impact the timing of each measurement interval depending on the test condition.
That being said and as Andrea notes, you can only take up to 4096 samples. At one second per reading, this is a little more than 68 minutes per ITM. At a little more than an hour, it would be necessary to duplicate this test 64 to 100 times.
In the timing window, enable timestamps, and uncheck the disable outputs at completion for all but the last test. Under Exit conditions, use the project setting. This will ensure that the test will completely stop if a compliance condition is detected.
Unfortunately, data management will be a challenging and tedious effort. At least you can run this test without using KULT.

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