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I’m doing some research on CMOS ICs and need to test them for Latch-up compliance based on standard JEDEC No. 78D, so I’m looking for an instrument capable of generating current and voltage pulses with the following minimum specifications:
Minimum Current Range: 50mA to 250mA.
Minimum Voltage Range: 0 to 10V.
Rise/Fall Time: 5us < tr < 5ms.
Min. Pulse width = 2 x tr. (2 times rise/fall time)
Max. Pulse width = 1 s.
It needs to have the possibility to limit current/voltage.
It could be only one instrument or two independent instruments.
- IC Latch Up Test - JESD78D.pdf
- JEDEC Standard
- (207.35 KiB) Downloaded 1095 times
- Keithley Applications
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- Joined: October 15th, 2010, 10:35 am
- Country: United States
Take a look at the 2600B Series of SourceMeter Instruments. These can be used in a multi-SMU configuration to accomplish the multi pin latch-up test.
You can control the pulse width but not the rise/fall time of the pulse generated by these instruments. But the pulses that they generate will comply with the not faster than 5usec and not slower than 5msec.
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