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Charge Retention Test of Non Volatile Memories using MOSCAP

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tarun_arora
Posts: 1
Joined: July 11th, 2015, 5:13 am
Country: India

Charge Retention Test of Non Volatile Memories using MOSCAP

Post by tarun_arora » July 11th, 2015, 5:21 am

I have fabricated a MOSCAP structure with a charge trapping Floating gate for Non Volatile memory. I have characterized my device for Dual sweep C-V measurements.
I wanted to do charge retention properties of my device. Please guide me, how to do it.

Thankyou in Anticipation!!

Abhay1
Posts: 8
Joined: March 18th, 2014, 11:01 pm
Country: India

Re: Charge Retention Test of Non Volatile Memories using MOSCAP

Post by Abhay1 » October 28th, 2015, 1:44 am

Hello Tarun
Hope you are doing fine.

Please find attached application note for generating pulse and doing charge trapping measurement using model 4200.
In your case, you will have do certain modification as you are having higher version of pulse unit i.e. PMU.

If you need further help, please directly write to me.
With best regards
Abhay Joshi
Attachments
2767 Pulse.pdf
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