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C-f Measurements

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poornendu
Posts: 2
Joined: March 10th, 2011, 8:03 pm
Country: India

C-f Measurements

Post by poornendu » March 10th, 2011, 9:02 pm

Capaciatnce of our semiconductor thin film resonates at particular frequency, which I need to find out. For this I'm using 4200-SCS with CVU.
It only allows to carry out measurements over 37 frequency from 1kHz to 10 MHz. I understand that calibration is probably done only at
certain locations, but that can always be interpolated to increase number of frequency samples.

What can I do to increase the number of data points in this C-f sweep.

Jeremy G
Keithley Applications
Keithley Applications
Posts: 76
Joined: April 29th, 2010, 7:56 am
Country: United Kingdom

Re: C-f Measurements

Post by Jeremy G » March 11th, 2011, 6:38 am

It is not possible to increase the number of sweep points beyond 37. There are 10 points per decade across 4 decades, we arrive at 37 points by not counting the start frequency when it was the stop frequency from the previous decade:

• 1 kHz to 10 kHz in 10 kHz steps
• 10 kHz to 100 kHz in 10 kHz steps
• 100 kHz to 1 MHz in 100 kHz steps
• 1 MHz to 10 MHz in 1 MHz steps

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