Tektronix Technical Forums are maintained by community involvement. Feel free to post questions or respond to questions by other members. Should you require a time-sensitive answer, please contact your local Tektronix support center here.
I want to study the I-V characteristics of a thin film using in-plane electrodes and 2 tungsten probe tips. The problem I am facing is that the I-V characteristics measured for the thin film is the same when measured with the probe tips in air. I checked the resistivity of the electrodes and the mechanical contact between probe tips and the electrodes and everything is ok. Am I making an error?
I am using Keithley 6487 and a cryogenic probe station from Lake Shore
- Keithley Applications
- Posts: 2849
- Joined: June 10th, 2010, 6:22 am
- Country: United States
Check to verify the Model 6487 is operating properly and connected properly.
Use HI MEG resistor (e.g. 100M ohm) and run a sweep on that.
Here is how I would expect to to be connected...
Voltage Source HI to on side of the resistor.
Other side of the resistor to input HI (Inner conductor of the triax input).
Voltage Source LO to Input LO (inner shield of the triax input).
Now apply 100V and see if it measures 100M or 1nA.
Who is online
Users browsing this forum: No registered users and 1 guest