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I want to study the I-V characteristics of a thin film using in-plane electrodes and 2 tungsten probe tips. The problem I am facing is that the I-V characteristics measured for the thin film is the same when measured with the probe tips in air. I checked the resistivity of the electrodes and the mechanical contact between probe tips and the electrodes and everything is ok. Am I making an error?
I am using Keithley 6487 and a cryogenic probe station from Lake Shore
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- Joined: June 10th, 2010, 6:22 am
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Check to verify the Model 6487 is operating properly and connected properly.
Use HI MEG resistor (e.g. 100M ohm) and run a sweep on that.
Here is how I would expect to to be connected...
Voltage Source HI to on side of the resistor.
Other side of the resistor to input HI (Inner conductor of the triax input).
Voltage Source LO to Input LO (inner shield of the triax input).
Now apply 100V and see if it measures 100M or 1nA.
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